Analytical Services, Resonance Ionization Mass Spectrometry, SIMS

SERVICES

Atom Sciences provides a variety of analytical services using time-of-flight mass spectrometry (TOF-MS). These services include:

Surface Analyses, depth profiles, and 2-d imaging by

Secondary Ion Mass Spectrometry (SIMS).

Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS).

Simultaneous SIMS and SIRIS.

Gas Analyses

Consulting

For pricing information or to discuss your analytical needs, call the phone number listed below, or email info@atom-sci.com.

(865) 483-1113 (voice), (865) 483-3316 (FAX)
Copyright^ã 2003-2008 Atom Sciences, Inc.
Last Modified Aug 25, 2008