ASI Home Support Equipment

 

Custom Instrumentation

Atom Sciences provides Time-of-Flight mass spectrometers customized to our customer's specifications. We design, order components, assemble, test, and install turnkey systems. If components are not available from other vendors, we will manufacture the needed parts in some cases.

Examples of instrumentation include:

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  Electron-impact ionization - Reflectron TOF with Knudsen Cell capable of 1800 C

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  Electron-impact ionization - Reflectron TOF with pulsed valve

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  MALDI Reflectron TOF

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  Linear TOF with custom data acquisition system for catalysis experiments

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  Secondary Ion Mass Spectrometer (SIMS)

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  SIRIS TOF system (see below)

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  Support equipment (preamplifier)

 

SIRIS

(Sputter-Initiated Resonance Ionization Spectroscopy)

Steps in a SIRIS analysis

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Desorption and atomization of a small portion of the sample by an energetic ion beam (sputtering)

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Suppression of ions formed during the sputtering process

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Selective laser ionization of sputtered neutrals (Resonance Ionization Spectroscopy, RIS)

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Time-of-Flight mass spectrometry of ions

Atom Sciences has over 25 years of experience with the SIRIS process and instrumentation. We supply a complete SIRIS instrument with the following features:

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  Laser system including Nd:YAG laser pumping two wavelength-tunable lasers

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  Standard system comes with choice of microfocus ion gun (50 mm spot size) or a liquid metal ion gun (100 nm spot size); both ion guns available as an option

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  x, y, z, q  sample manipulator with sub-mm resolution in x and y

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  16 position carousel to hold samples

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  Electrostatic analyzers to essentially eliminate interference from non-selective surface ionization

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  Combination microchannel plate - scintillator - photomultiplier tube for high gain detection with excellent pulse height distribution

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  One week of in-house training on operation of instrument and interpretation of SIRIS data

Call for pricing information!

 

 

  (865) 483-1113 (voice), (865) 483-3316 (FAX)
Copyright
ã 2003-2008 Atom Sciences, Inc.
Last Modified Aug 25, 2008