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Simultaneous SIMS and SIRIS Analyses

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SIMS analysis is interleaved between laser pulses used for SIRIS

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Allows extremely sensitive and quantitative results for a single element with a simultaneous survey of all other components in the sample

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Exactly identifies the point when a depth profile passes into a new layer

Atom Sciences is now offering SIMS-SIRIS analysis as a commercial analytical service.

Below are SIMS and SIRIS analyses of a layered sample containing a small amount of Cu (masses 63 and 65). These results were obtained simultaneously using SIMS interleaved between SIRIS analysis pulses.

 

This capability was made possible through a Small Business Innovative Research Grant from the National Science Foundation (DMI-9800951).

 

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Copyrightã 2003-2008 Atom Sciences, Inc.
 Last Modified Aug 25, 2008